Smart Card Tests (Windows Embedded CE 6.0)

1/6/2010

The following table shows the smart card tests that are found in the Windows Embedded CE 6.0 Test Kit (CETK).

In This Section

• Smart Card Reader Tests
  **Applies to Windows Embedded CE 6.0 R2

  Includes version 2 of the PC/SC Workgroup's IFDTest test suite, insertion and removal tests, and multiple card reader tests. For more information about the test suite and the tests, see the PC/SC Workgroup's Web site.**

• Smart Card Resource Manager Test
  Includes multi-smart card queries, tracking tests, access tests, and direct access tests

See Also

Other Resources

CETK Tests