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Running the Smart Card Reader Insertion and Removal Test (Windows Embedded CE 6.0)

1/6/2010

The Smart Card Reader Insertion and Removal Test verifies that insertion or removal of a smart card reader leaves the smart card subsystem in an appropriate state. To run this test by using the default values, at the command line type tux -o -d ifdtesttux -x 2000.

Note

If the device being tested has a display, the display shows instructions for running the test, status of the test, and test results. If the device being tested does not have a display screen, instructions, status, and test results display in the Output window for Platform Builder.

The following examples show command lines and describe the corresponding behavior of the test.

tux -o -d ifdtesttux -x2000

  • Runs one iteration of the entire test.
  • Requires detaching and attaching the smart card reader 5 times during the test.

tux -o -d ifdtesttux -x2000 -c"-n 5 -p 3 -c"

  • Runs five iterations of the entire test.
  • Requires detaching and attaching the smart card reader 3 times during each iteration of the test.
  • Does not require the card be removed from the card reader on each iteration of the test.

To run the Smart Card Reader Insertion and Removal Test

  1. Specify the number of iterations of the entire test by using the -c "-n <test_iterations>" command–line parameter. If you run the test with the default command line, the entire test runs once.

  2. Specify the number of times per iteration of the test that the smart card reader is detached and attached by using the -c "-p <iterations>" command–line parameter.

    If you run the test with the default command line, you must detach and attach the smart card reader 5 times per iteration of the test.

    By default, the test requires that you remove the smart card from the card reader after completion of AutoIFD on alternating iterations of the test. You can configure the test to bypass this requirement by specifying the -c "-c" command–line parameter.

  3. Detach the smart card reader from the system and then attach the smart card reader to the system. Continue to detach and attach the smart card reader as many times as specified when setting up the test.

    The test opens a handle to the card reader and runs AutoIFD, which is the one–card version of the smart card protocol tests. For more information, see Smart Card Reader Test (IFDTest2).

    After it has finished running AutoIFD, the test closes the handle to the smart card reader.

See Also

Concepts

Smart Card Reader Test (IFDTest2)

Other Resources

Smart Card Reader Insertion and Removal Test