Running the Smart Card Reader Removal When Blocked Test (Windows Embedded CE 6.0)
1/6/2010
Applies to Windows Embedded CE 6.0 R2
The following procedure describes the steps for running the Smart Card Reader Removal When Blocked Test. To run this test using the default values, at the command-line type tux -o -d ifdtesttux -x 2002.
Note
If the system being tested has a display, the instructions, progress, and test results will be shown on the system display. However, if the system does not have a display screen, the instructions, progress, and test results will be displayed in the Windows Embedded CE 6.0 R2 (and later versions) Output window.
Procedure
To run the Smart Card Reader Removal When Blocked Test
The test operator attaches a smart card reader to the system.
The test opens a handle to the card reader and requests that a smart card be removed or inserted.
Test sets up a blocking call so that the smart card reader is waiting for a smart card to be inserted or removed.
The test operator removes the smart card reader from the system.
Test closes the handle to the smart card reader.
Alternating iterations of the test will demonstrate how the system behaves when the reader is blocked for either smart card insertion or removal.
You can specify the number of test iterations by using the -c "-n iterations" command-line parameter. For more information, see Command-Line Parameters for the Smart Card Reader Removal When Blocked Test.