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Windows Embedded Test Catalog (Compact 7)

3/12/2014

The Windows Embedded Test catalog is the master list of all test cases that are included in the CTK. Each test area, such as Display or Networking, contains a number of individual tests that you can select and run. The current Windows Embedded Test catalog includes the following tests:

  • Accelerometer
  • Audio
  • Backlight
  • Battery
  • Bootloader
  • Cellular
  • Communication Bus
  • Display
  • File System
  • Input
  • Kernel
  • Multimedia
  • Networking
  • NLED (Notification light-emitting diode)
  • OAL (OEM Abstraction Layer)
  • Power Manager
  • Security
  • Shell
  • Smart Card
  • Storage Media
  • USB

See Also

Concepts

Manage Tests