Windows Embedded Test Catalog (Compact 7)
3/12/2014
The Windows Embedded Test catalog is the master list of all test cases that are included in the CTK. Each test area, such as Display or Networking, contains a number of individual tests that you can select and run. The current Windows Embedded Test catalog includes the following tests:
- Accelerometer
- Audio
- Backlight
- Battery
- Bootloader
- Cellular
- Communication Bus
- Display
- File System
- Input
- Kernel
- Multimedia
- Networking
- NLED (Notification light-emitting diode)
- OAL (OEM Abstraction Layer)
- Power Manager
- Security
- Shell
- Smart Card
- Storage Media
- USB