What's New in the Compact Test Kit (Compact 7)
3/12/2014
The Windows Embedded Compact Test Kit (CTK) is a new application with the following key features:
- Improved user interface that resembles Microsoft Visual Studio
- Ability to group user-selected test cases into test passes
- Improved test results viewer allows you store and review test results per test pass
- Upon connection to a device, detection of peripherals and drivers needed for tests
- Integration with the new Graph Tool to graph performance test results
- Automated test passes using the new Windows Embedded Compact Test Kit (CTK) Automation Tool Solution (CATS) tool
- Stress testing using the new Compact Stress tool
- Ability to add custom Tux test harness (TUX)-based tests to the CTK
- Support for x86, MIPSII, MIPSII_FP, ARMv5, ARMv6, ARMv7, and SH4 processors